Thursday, February 21, 2008

International Objective Measurement Workshop in NYC!

In the olden day, Raschites and 3PL researchers fought with so much vigor that they separated ways. I recall one AERA/NCME conference with Ron Hambleton on the right, Ben Wright on the left, and nothing but a "DMZ" in between. Well, times have changed, and more moderate heads have prevailed. Hence, those of you attending the AERA/NCME national conference in New York City should consider coming early and checking out the International Objective Measurement Workshop (IOMW). The workshop is held the two days prior to AERA and provides an excellent opportunity to hear about the latest developments in measurement.

The preliminary program for IOMW 2008 is now available. The conference will be held March 22 and 23, 2008 at New York University (NYU) in New York City. There are 48 paper presentations and 2 computer demonstrations scheduled. The preliminary program and the conference registration form can be found on the Journal of Applied Measurement (JAM) web site.

Early registration is currently open and in effect until March 14, 2008. Register now and save $10 on the registration fee. Late and onsite registration will also be available.

Hotel information can be found on the NYU web site. But hey, this is NYC, and it is easy to get anywhere from anywhere.

So check it out. If you have to travel all the way to NYC, you should at least take this opportunity to extend your stay over the front-end weekend.

Send your comments on this entry to

No comments: